The current economic crisis has already affected almost every industry around the globe including both IT and technology industry. Recently two technology giants Google and Lenovo announced of significant shortening of their contract (Google) and permanent employees. This global economic climate has changed the outsourcing behavior of many IT companies by placing additional constraints on their budgets and makes them seek to get more for less.
Given this tight economic conditions it's very reasonable to figure out how you can organize your IT more efficiently. For test engineers it can be translate into how to perform testing more cost-efficiently than ever before. Followed this uneasiness National Instruments (NI), a worldwide player in test and measurement recently identified main trends that will significantly improve the efficiency of test and measurement systems in 2009. So here they are, software-defined instrumentation, parallel processing technologies and new methods for wireless and semiconductor test. As NI claims these trends will help engineers develop faster and more flexible automated test systems, while reducing their overall cost of test, companies from all industry segments will achieve significant benefits from applying these methods on board.
More and more engineers are using software-defined instrumentation along with the latest commercial technologies to achieve new levels of measurement performance and lower test costs by applying the latest technological advancements such as multicore processing and field-programmable gate arrays (FPGAs) in their test systems to meet the demands of new application areas such as wireless and protocol-aware test.
Prepared by TestLabs of Mirasoft Group Ukraine-based offshore IT service provider
Based on publications: National Instuments
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